Quality:
![](/images/puzzle2/128/0.png)
Fourier profilometry - method for measuring profiles using distortions in periodic patterns. Article "Fourier profilometry" in English Wikipedia has 1.6 points for quality (as of November 1, 2023).
The article also contains quality flaw template, which reduce quality score.
Since the creation of article "Fourier profilometry", its content was written by 6 registered users of English Wikipedia and edited by 6 registered Wikipedia users in all languages.
The article is cited 2 times in English Wikipedia and cited 2 times in all languages.
The highest Authors Interest rank from 2001:
- Local (English): #166945 in June 2014
- Global: #349652 in April 2005
The highest popularity rank from 2008:
- Local (English): #1263927 in June 2008
- Global: #2072998 in March 2008
There is 1 language version for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from November 1, 2023 (including revision history and pageviews for previous years).